Exploring the Capability of HAADF-STEM Techniques to Characterize Graphene Distribution in Nanocomposites by Simulations

Figure 1

(a) Atomic model for the tomography study. HAADF-STEM-simulated images at different tilt angles with respect to the beam direction along the -axis: -90° (b), -70°(c), -45° (d), 0° (e), 45° (f), and 82.5° (g). Graphene sheets can be detected within the amorphous matrix only in the tilted 2D projections which are almost parallel to the beam direction. In Figure 1(b), graphene layers are perfectly distinguished, and in Figure 1(g) their position - marked with white squares - can be estimated.

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