VLSI Design

Particle Swarm Optimization for Constrained Instruction Scheduling

Design and Characterization of the Next Generation Nanowire Amplifiers

An Energy-Efficient Multiwire Error Control Scheme for Reliable On-Chip Interconnects Using Hamming Product Codes

A Programmable Max-Log-MAP Turbo Decoder Implementation

A Robust Low-Voltage On-Chip LDO Voltage Regulator in 180 nm

A Phase-Locked Loop with 30% Jitter Reduction Using Separate Regulators

Fine Control of Local Whitespace in Placement

Selected Papers from the International Mixed Signals Testing and GHz/Gbps Test Workshop

A Dependable Microelectronic Peptide Synthesizer Using Electrode Data

Simple Evaluation of the Nonlinearity Signature of an ADC Using a Spectral Approach

VLSI Implementation of Hybrid Wave-Pipelined 2D DWT Using Lifting Scheme

Choice of a High-Level Fault Model for the Optimization of Validation Test Set Reused for Manufacturing Test

Built-in Test Enabled Diagnosis and Tuning of RF Transmitter Systems

Integrated VCOs for Medical Implant Transceivers

Using Signal Envelope Detection for Online and Offline RF MEMS Switch Testing

VLSI Design

Table of Contents

Table of Contents: 2008

Particle Swarm Optimization for Constrained Instruction Scheduling

Design and Characterization of the Next Generation Nanowire Amplifiers

An Energy-Efficient Multiwire Error Control Scheme for Reliable On-Chip Interconnects Using Hamming Product Codes

A Programmable Max-Log-MAP Turbo Decoder Implementation

A Robust Low-Voltage On-Chip LDO Voltage Regulator in 180 nm

A Phase-Locked Loop with 30% Jitter Reduction Using Separate Regulators

Fine Control of Local Whitespace in Placement

Selected Papers from the International Mixed Signals Testing and GHz/Gbps Test Workshop

A Dependable Microelectronic Peptide Synthesizer Using Electrode Data

Simple Evaluation of the Nonlinearity Signature of an ADC Using a Spectral Approach

VLSI Implementation of Hybrid Wave-Pipelined 2D DWT Using Lifting Scheme

Choice of a High-Level Fault Model for the Optimization of Validation Test Set Reused for Manufacturing Test

Built-in Test Enabled Diagnosis and Tuning of RF Transmitter Systems

Integrated VCOs for Medical Implant Transceivers

Using Signal Envelope Detection for Online and Offline RF MEMS Switch Testing