Review Article
Overview on Radiation Damage Effects and Protection Techniques in Microelectronic Devices
Table 2
Classification and definition of single-particle effect [
34].
| Mistake | Type | Definition |
| Soft error | Single event upset | Change of logical state in storage units | Single event multibit flip | Bit storage state change | Single event disturbances | Transient change in storage unit | Single event transient | Transient voltage change caused by current |
| Hard error | Single event latch | Regenerative state of high current in PN structure | Single event burnout | High current leads to device burnout | Single event gate rupture | The gate dielectric breaks down due to the large current flowing through it | Single-event displacement damage | Permanent damage caused by displacement effect | Single event functional interrupt | Control component malfunction caused by flipping | Single bit error | Errors that occur in a single bit and cannot be corrected or recovered |
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