Review Article
Overview on Radiation Damage Effects and Protection Techniques in Microelectronic Devices
Table 1
Radiation environment, radiation particles, radiation effects and test simulators [
14].
| Radiation environment | Radiation particle | Failure mechanism | Test simulation mechanism |
| Space environment | 10 Mev∼100 Mev electrons, protons | Total dose effect | 60Co-γ | Low energy X-ray device | 100 Mev∼several GeV electrons, protons | Single particle effect | Cyclotron |
| Nuclear explosion | Tens to hundreds of grays | Total dose effect | 60Co-γ | Low energy X-ray device | 100 keV∼several MeV neutron flux | Displacement damage | Nuclear reactor | Single particle effect |
| Reactor | Steady state neutron flux | Displacement damage | Nuclear reactor | Several MeV gamma rays | Total dose effect | 60Co-γ | Low energy X-ray device |
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