Planar Sensor for Material Characterization Based on the Sierpinski Fractal Curve

<table class="table-group" id="tab1"><tr><td><table class="table"><tr><td class="thead-hr" colspan="3"><hr/></td></tr><tr class="thead"><td class="align_left">Sample</td><td class="align_center">Height (h)</td><td class="align_center"><span style="width: 10.2907ptpx;"><svg height="6.1673pt" id="M23" style="vertical-align:-0.2063904pt" version="1.1" viewbox="-0.0498162 -5.96091 10.2907 6.1673" width="10.2907pt" xmlns="http://www.w3.org/2000/svg" xmlns:xlink="http://www.w3.org/1999/xlink"><g transform="matrix(.013,0,0,-0.013,0,0)"><path d="M387 375C387 402 357 448 257 448C172 448 82 404 82 326C82 289 108 255 156 241V239C85 223 23 181 23 116C23 39 89 -12 182 -12C265 -12 336 31 378 91L361 114C320 73 269 47 216 47C157 47 115 82 115 137C115 191 160 219 218 219C243 219 262 218 272 217L304 259L302 266C295 265 281 264 255 264C195 264 163 294 163 335C163 377 200 416 249 416C293 416 321 389 329 342C331 332 335 329 341 329C355 329 387 352 387 375Z"></path></g><g transform="matrix(.013,0,0,-0.013,5.331,0)"><path d="M181 342V451C133 431 89 419 40 411V388C98 381 102 377 102 311V104C102 38 95 32 33 26V0H263V26C186 32 181 38 181 104V287C203 343 235 372 261 372C277 372 289 366 304 352C310 346 318 345 330 350C349 359 362 379 362 399C362 422 338 449 304 449C256 449 213 393 183 342H181Z"></path></g></svg></span></td></tr><tr><td class="thead-hr" colspan="3"><hr/></td></tr><tr><td class="align_left">RT/duroid® 5880</td><td class="align_center">1.27 mm</td><td class="align_center">2.2</td></tr><tr><td class="align_left">FR-4</td><td class="align_center">1.6 mm</td><td class="align_center">4.5</td></tr><tr><td class="align_left">AD1000™</td><td class="align_center">3 mm</td><td class="align_center">10.2</td></tr><tr class="table-tr"><td colspan="3"><hr class="tbody-hr"/></td></tr></table></td></tr></table>

Journal of Sensors

tab1

Table 1

Table 1: Planar Sensor for Material Characterization Based on the Sierpinski Fractal Curve 