Research Article
Comparison of Anterior Segment Measurements with Scheimpflug/Placido Photography-Based Topography System and IOLMaster Partial Coherence Interferometry in Patients with Cataracts
Table 2
The mean difference, limits of agreement (LoA), paired -test for these differences, and their significance for difference parameters between Sirius Scheimpflug/Placido photography-based topography system and IOLMaster partial coherence interferometry.
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ACD = anterior chamber depth, Kf = flattest keratometry, Ks = steepest keratometry, Km = mean keratometry, WTW = white to white, and SD = standard deviation. |