Research Article

Quantitative Analysis of Silicon Tetrachloride, Carbon Disulfide, and Dichloroethane Concentration by Raman Spectroscopy

Table 2

RSEP of SiCl4 and C2H4Cl2 concentration for the SiCl4-C2H4Cl2 binary system by quantitative analysis at different characteristic peaks.

SiCl4 (422 cm−1)C2H4Cl2 (754 cm−1)C2H4Cl2 (2968 cm−1)

Actual concentration (%)2.786.599.284.049.284.04
Estimated concentration (%)2.696.419.194.249.914.43
RSEP (%)2.812.177.32