Design Considerations for a Portable Raman Probe Spectrometer for Field Forensics
Figure 10
Intensity corrected and normalized FT-Raman spectra of pure RDX (offset in upper trace) and PETN (lower trace) excited with a 1064 nm laser. Instrument resolution was set to 2 cm−1. Both spectra were obtained with a Bruker FT-Raman system using the protocols described in [31]. The FT-Raman spectra of the pure materials were scaled from 0 to 2.0 for the largest band.
