Confirmation of the Degradation of Single Junction Amorphous Silicon Modules (a-Si:H)

Table 1

Measured performance parameters of the seven modules investigated in this work. The corrected Standard Test Condition (STC) values are also listed for comparison.

Module	Measured					STC corrected
	(A)	(V)	(W)	(%)	(%)	(W)	(%)
1	1.30	21.7	12.8	52.8	9.6	14.0	10.5
2	1.24	22.2	12.3	53.9	9.2	13.8	10.3
3	1.16	23.3	10.8	46.0	8.1	12.3	9.2
4	1.03	22.1	8.60	43.1	5.4	12.7	8.6
5	1.14	22.3	8.90	45.0	5.7	10.9	8.6
6	1.29	23.2	12.9	53.1	9.4	15.4	10.7
7	1.01	23.2	10.4	48.6	7.8	11.9	8.9
Average	1.17	22.6	11.0	48.9	8.0	12.7	9.5
% diff	18.01	5.15	32.81	20.04	43.75	29.71	30.58