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International Journal of Microwave Science and Technology
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Special Issues
International Journal of Microwave Science and Technology
/
2016
/
Article
/
Fig 4
/
Research Article
The Terahertz Controlled Duplex Isolator: Physical Grounds and Numerical Experiment
Figure 4
The dependence of the reflection on a frequency and an incidence angle (
= 30°,
= 50°),
mm, and
= 1.3125.