Characterization of NixZn1−xFe2O4 and Permittivity of Solid Material of NiO, ZnO, Fe2O3, and NixZn1−xFe2O4 at Microwave Frequency Using Open Ended Coaxial Probe

<div>SEM micrograph of (a) Ni0.1Zn0.9Fe2O4, (b) Ni0.3Zn0.7Fe2O4, (c) Ni0.5Zn0.5Fe2O4, (d) Ni0.7Zn0.3Fe2O4, and (e) Ni0.9Zn0.1Fe2O4 sample at 60000 magnifications.</div>

International Journal of Microwave Science and Technology

fig6

Figure 6

Figure 6: Characterization of NixZn1−xFe2O4 and Permittivity of Solid Material of NiO, ZnO, Fe2O3, and NixZn1−xFe2O4 at Microwave Frequency Using Open Ended Coaxial Probe

Figure 6 | Characterization of NixZn1−xFe2O4 and Permittivity of Solid Material of NiO, ZnO, Fe2O3, and NixZn1−xFe2O4 at Microwave Frequency Using Open Ended Coaxial Probe 