Research Article

Chaos and Symbol Complexity in a Conformable Fractional-Order Memcapacitor System

Table 7

NIST test result of binary sequences generated by the CFM system.

Tests valueProportionSuccess

Frequency (1)0.334597/100
B. Frequency (1)0.6163100/100
C. Sums (2)0.955899/100
Runs (1)0.181699/100
Longest Run (1)0.213399/100
Rank (1)0.319199/100
FFT (1)0.196899/100
N.O. Temp (148)0.028897/100
O. Temp (1)0.719797/100
Universal (1)0.534199/100
App. Entropy (1)0.816557/58
R. Excur. (8)0.01057/58
R. Excur. V. (18)0.017958/58
Serial (2)0.554499/100
L. Complexity (1)0.102599/100