Active and Passive Electronic Components

Metal-Insulator-Semiconductor Field-Effect Transistors


Publishing date
01 Feb 2013
Status
Published
Submission deadline
14 Sep 2012

Lead Editor

1Department of Electronic Engineering, I-Shou University, Kaohsiung 840, Taiwan

2Department of Electronic Engineering, National Chiao Tung University, Hsinchu 300, Taiwan

3Department of Electrical Engineering, Institute of Microelectronics, National Cheng Kung University, Tainan 701, Taiwan

4Department of Electrical Engineering, National Central University, Taoyuan 320, Taiwan

5Department of Physical Electronics, Tokyo Institute of Technology, Tokyo 152-8552, Japan


Metal-Insulator-Semiconductor Field-Effect Transistors

Description

In the last few decades, there has been a tremendous progress in metal-insulator-semiconductor field-effect transistors (MISFETs) and their applications. Among the various materials, Ge, III-V, and III-N semiconductors have attracted considerable attention for MISFETs fabrication. These devices are used in a large number of different circuits such as power amplifiers, low-noise amplifiers, mixers, frequency converters, and phase shifters. Also, the high-k materials are now playing an important role in the future high-mobility-channel devices for improving the required performance.

We invite authors to contribute original research as well as review articles on the recent progress in all kinds of MISFETs and their applications. Potential topics include, but are not limited to:

  • High-k dielectrics on Ge, III-V, and III-N MISFETs
  • Novel methods or concepts for Ge, III-V, and III-N MISFETs
  • Characterization of high-k dielectric/high-mobility-channel material interfaces (including physical, chemical, and electronic properties)
  • Electronic or optoelectronic applications for Ge, III-V, and III-N MISFETs
  • Status of related material/process development (e.g., 3D MISFETs, III-V growth on Si, or others)
  • Simulation or modeling of MISFETs

Before submission authors should carefully read over the journal's Author Guidelines, which are located at http://www.hindawi.com/journals/apec/guidelines/. Prospective authors should submit an electronic copy of their complete manuscript through the journal Manuscript Tracking System at http://mts.hindawi.com/ according to the following timetable:


Articles

  • Special Issue
  • - Volume 2013
  • - Article ID 596065
  • - Editorial

Metal-Insulator-Semiconductor Field-Effect Transistors

Kuan-Wei Lee | Edward Yi Chang | ... | Yasuyuki Miyamoto
  • Special Issue
  • - Volume 2013
  • - Article ID 627873
  • - Research Article

A Novel Nanoscale FDSOI MOSFET with Block-Oxide

Jyi-Tsong Lin | Yi-Chuen Eng | Po-Hsieh Lin
  • Special Issue
  • - Volume 2012
  • - Article ID 148705
  • - Research Article

Comprehension of Postmetallization Annealed MOCVD- on Treated III-V Semiconductors

Ming-Kwei Lee | Chih-Feng Yen
  • Special Issue
  • - Volume 2012
  • - Article ID 459043
  • - Research Article

GaN-Based High-k Praseodymium Oxide Gate MISFETs with + UV Interface Treatment Technology

Chao-Wei Lin | Hsien-Chin Chiu
  • Special Issue
  • - Volume 2012
  • - Article ID 359580
  • - Research Article

Comparative Study of , , and BeO Ultrathin Interfacial Barrier Layers in Si Metal-Oxide-Semiconductor Devices

J. H. Yum | J. Oh | ... | S. K. Banerjee
  • Special Issue
  • - Volume 2012
  • - Article ID 729328
  • - Research Article

Gate Stack Engineering and Thermal Treatment on Electrical and Interfacial Properties of Ti/Pt/HfO2/InAs pMOS Capacitors

Chung-Yen Chien | Jei-Wei Hsu | ... | Pei-Wen Li
  • Special Issue
  • - Volume 2012
  • - Article ID 872494
  • - Research Article

The Improvement of Reliability of High-k/Metal Gate pMOSFET Device with Various PMA Conditions

Yi-Lin Yang | Wenqi Zhang | ... | Wen-kuan Yeh
Active and Passive Electronic Components
 Journal metrics
See full report
Acceptance rate10%
Submission to final decision90 days
Acceptance to publication14 days
CiteScore1.500
Journal Citation Indicator0.080
Impact Factor0.4
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