SEM images of deposited and annealed silver, showing different crystal sizes. The samples show the silver that occurs at the dielectric/silver interface, and the samples were prepared by removing the deposited and annealed silver films from the dielectric using adhesive tape. Both scale bars are 1 micron. (a) With 120 degrees C annealing for 2 hours. (b) With 400 degrees C annealing for 60 seconds. Note the much larger crystal grains, and also twinning defects.
