Noise and Electrical Oscillations Generation during the Investigation of the Resistive Switching in the Yttria Stabilized Zirconia Films by Conductive Atomic Force Microscopy

<div>A waveform (a) and the power spectrum (b) of noise signal generated during the resistive switching in AFM probe contact to the YSZ/Si film.</div>

Advances in Condensed Matter Physics

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Figure 4

Figure 4: Noise and Electrical Oscillations Generation during the Investigation of the Resistive Switching in the Yttria Stabilized Zirconia Films by Conductive Atomic Force Microscopy 

Figure 4 | Noise and Electrical Oscillations Generation during the Investigation of the Resistive Switching in the Yttria Stabilized Zirconia Films by Conductive Atomic Force Microscopy 