The Influence of Surface Morphology of Buffer Layer on the Critical Current Density in YBCO Coated Conductors

Figure 2

Typical XRD patterns of CeO₂/YSZ/Y₂O₃ buffer layer (a) θ-2θ scan, (b) ω-scan of (002) CeO₂, and (c) ϕ-scan of (111) CeO₂.

(a)

(b)

(c)